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ELOVIS
gauges use a special form of dual-beam laser interferometer
technology to measure product velocity, with extremely high accuracy.
The velocity is integrated
over time to measure length. The laser
beams intersect in a certain angle and form a pattern of equally spaced
bright and dark fringes (fringe distance is a function of laser
wavelength and beam angle). Laser light, which is reflected from the
moving surface is scattered through this fringe pattern and thus cause
an intensity modulation with a frequency which is proportional to the
speed of the moving surface, the so-called doppler frequency. There is
no need for any markings on the moving surface. The
reflected light is collected and converted into an electrical signal by
a
photo detector. Sophisticated algorithms in combination with a high
performance DSP compute the actual speed and length with an accuracy up
to 0,01% and better.
ELOVIS interferometer technology
is not affected by any kind of surface (structure, colour, gloss level,
reflectivity, light absorption, unevenness, ...). ELOVIS systems, in
more than 95% of all applications, will run without a application
specific parametration. ELOVIS systems set standards in lifetime,
reliability, size, variability and ease of operation. Please contact us
to get more details!